Episode
SiC reliability testing for making chips that last
- Podcast
- Podcast4Engineers
- Published
- Dec 10, 2024
- Duration seconds
- 901
- Processing state
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Summary
How can we make sure our chips work reliably for decades without having decades to test them? In this episode, we dive deep into the topic of silicon carbide (SiC) reliability testing with our expert guest Paul Salmen. Be sure to check out the training Paul mentions to learn more about gate oxide reliability for CoolSiC™ devices.